Variational Inference from Ranked Samples with Features

Abstract

In many supervised learning settings, elicited labels comprise pairwise comparisons or rankings of samples. We propose a Bayesian inference model for ranking datasets, allowing us to take a probabilistic approach to ranking inference. Our probabilistic assumptions are motivated by, and consistent with, the so-called Plackett-Luce model. We propose a variational inference method to extract a closed-form Gaussian posterior distribution. We show experimentally that the resulting posterior yields more reliable ranking predictions compared to predictions via point estimates.